FailureMode
Potential Induced Degradation (PID)
- ID
fm:potential-induced-degradation
- IRI
https://solarlattice.org/kb/fm/potential-induced-degradation
- Status
- active
- Also known as
- PID
- Category
- Modules
PID is module degradation driven by high voltage between the cells and the grounded frame. The voltage grows with the number of modules in a string and drives leakage currents. Heat, humidity, wet surfaces and soiling speed it up. Cells near the frame and modules at one end of the string are hit hardest. You usually cannot see it by eye. What you see is a power loss that keeps growing, and string losses can reach 20 to 80 percent. Infrared imaging in sunlight often shows warmer cells along the bottom frame or a patchwork pattern. EL imaging at low current shows dark cells near the frame and catches PID early. Confirm it and measure the loss with IV curve tracing or Voc checks. Look for a lower fill factor and lower Voc, and for lower Isc in the polarization type. To prevent it, keep modules clean, use grounding or offset boxes that apply reverse voltage at night, and choose PID-resistant modules. If you catch it early, reversing the bias polarity can regenerate affected modules. Corrosion damage at later stages cannot be reversed.
<!-- review notes
- sentence 1: support check: partial - Voltage between cells and frame growing with series modules and leakage currents is stated, but 'grounded frame' is not explicit.
- sentence 3: support check: partial - Not visible by eye and growing power loss stated, and up to 20-80% string loss, but 'can reach' matches only as an upper bound.
-->
Claims
caused_by
c1 verified · fact
High voltage to ground
Stress grows with the number of modules in series; p-type cells degrade in negative-polarity strings, n-type in positive-polarity strings.
verified by: joshuahamsaverified on: 2026-10-16
c2 drafted · lead
Leakage current
PID-s is driven by leakage current through the front glass and encapsulant.
c3 drafted · lead
Sodium ion migration
Na+ ions moving mainly from the glass into the cell create shunts.
c4 drafted · lead
Moisture exposure
Humidity, rain wetting and condensation speed up degradation; the electrochemical form is corrosion from moisture ingress.
review note: support check: partial - Humidity, rain wetting and condensation accelerate PID and electrochemical corrosion from moisture infiltration is listed, but moisture as a cause of PID itself is only acceleration.
c5 drafted · lead
High operating temperature
review note: support check: partial - Temperature is said to accelerate PID, but not that high operating temperature is a cause.
c6 drafted · lead
Surface soiling
Dust carrying positive charges increases PID risk.
affects
c7 verified · fact
Solar cell
verified by: joshuahamsaverified on: 2026-10-16
c8 drafted · lead
Module front glass
Leakage path and sodium source.
presents_as
c9 drafted · lead
Gradual performance decline
c10 verified · fact
Warm cells near frame
IR pattern of warmer cells near the bottom frame or a patchwork pattern, strongest in modules near one string pole.
verified by: joshuahamsaverified on: 2026-10-16
c11 drafted · lead
Hotspot in IR image
review note: support check: partial - Hot spots are mentioned and IR thermography reveals hotspots, but the primary IR pattern is warmer cells; hotspots are secondary/late.
c12 drafted · lead
Reduced fill factor
Typical of PID-s, along with lower shunt resistance; more visible under low light.
c13 drafted · lead
Low module open-circuit voltage
c14 verified · fact
Reduced short-circuit current
Mainly PID-p; for PID-s Isc only drops in a very advanced stage.
verified by: joshuahamsaverified on: 2026-10-16
c15 verified · fact
Dark regions in EL image
PID-s cells near the frame show reduced luminescence, especially at low current bias.
verified by: joshuahamsaverified on: 2026-10-16
detected_by
c16 verified · fact
Electroluminescence imaging
EL at about one tenth of rated current can find PID early, before power loss is noticed.
verified by: joshuahamsaverified on: 2026-10-16
c17 drafted · lead
Infrared thermography
c18 drafted · lead
IV curve tracing
Used to confirm and quantify loss together with IR or EL.
c19 drafted · lead
Open-circuit voltage measurement
c20 verified · fact
PID susceptibility lab test
IEC 62804 chamber test; a module fails above 5% power degradation.
verified by: joshuahamsaverified on: 2026-10-16
leads_to
c21 drafted · lead
Discoloration
c22 drafted · lead
Delamination
c23 drafted · lead
Severe Metallization Corrosion
Corrosion appears as a secondary failure in advanced stages; not reversible.
mitigated_by
c24 verified · fact
Regular cleaning
verified by: joshuahamsaverified on: 2026-10-16
c25 drafted · lead
System grounding scheme
For example setting the frame to a negative potential.
c26 drafted · lead
PV offset box
Applies reverse voltage overnight.
c27 drafted · lead
PID-resistant modules
c28 verified · fact
Alternative encapsulant material
Such as TPO.
verified by: joshuahamsaverified on: 2026-10-16
c29 drafted · lead
Low-ion front glass
c30 drafted · lead
Cell ARC layer optimization
Higher Si/N ratio or an added SiO2 layer under the ARC.
c31 verified · fact
Polarity reversal regeneration
PID-p can be fully regenerated; PID-s only if caught in time.
verified by: joshuahamsaverified on: 2026-10-16
typical_power_loss
c32 verified · fact
nominal 41 PERCENT
Conditions: Average performance loss reported for a 10.7 MW plant in Spain (Libby et al.)
verified by: joshuahamsaverified on: 2026-10-16
c33 drafted · lead
20–80 PERCENT
Conditions: Reduction of PV string performance after commissioning, per Libby et al.
review note: support check: partial - Source says 'up to 20-80%', an upper bound range, not a typical value.
c34 verified · fact
≥ 20 PERCENT
Conditions: Yield losses observed within 1 year in past field cases
verified by: joshuahamsaverified on: 2026-10-16review note: support check: partial - Source says losses of 20 percent and more within 1 year; 20% is a lower bound, not typical.
Referenced by
Data