Solar Lattice

DetectionMethod

Electroluminescence imaging

ID
method:el-imaging
IRI
https://solarlattice.org/kb/method/el-imaging
Status
active
Also known as
EL, EL imaging

Electroluminescence imaging puts the module or string in forward bias with a DC power supply and photographs the light the cells give off using a CCD, CMOS or InGaAs camera. The power supply has to be able to drive the short-circuit current, which can take roughly the module's open-circuit voltage depending on the technology. Most EL systems only work at night or in low light, or with curtains blocking stray light. Daylight systems exist but need advanced equipment and image processing. Keep the camera as close as possible to the module and perpendicular to it. In the field, tripods fixed to the string frame help with this, while drones struggle with orthogonality, focus and vibration. EL shows cracks with an easily recognized pattern. Field studies also used it to find cell fracture, deficient solder joints, short-circuited cells and bypassed substrings. EL also reveals metallization corrosion and light induced degradation, and it was used to image disconnected cell interconnections. A single image taken at one bias current and temperature cannot always identify the physical cause. Combining two bias currents, or adding thermography or photoluminescence, helps explain what the image shows.

<!-- review notes

Claims

produces

c1 verified · fact Crack pattern in EL image

Cracks show a signature pattern in EL that is easy to recognize.

verified by: joshuahamsaverified on: 2026-10-19

c2 verified · fact Lower EL intensity distribution

Histograms of EL pixel intensity tend to move toward lower intensities in modules with higher power loss. No clear link to specific defect types has been established yet.

verified by: joshuahamsaverified on: 2026-10-19

Referenced by

Data