Mitigation
Low-LID module selection
- ID
mit:low-lid-modules
- IRI
https://solarlattice.org/kb/mit/low-lid-modules
- Status
- active
Choosing module technologies with low susceptibility to light-induced loss, where relevant, is one of the listed mitigations for Light Induced Degradation (LID). Classic LID comes from boron-oxygen complexes. It was strongest in Czochralski-grown p-type mono cells, and mainly p-type multi and mono modules are affected. Gallium-doped p-type cells and n-type cells such as n-type PERC, HJT or n-PERT are affected much less or not at all, so these are the usual low-LID choices. When buying, check that the manufacturer uses LeTID-stable cells, verify the cell type in the bill of materials, and ask for test reports that state the percent power loss. Standard test procedures exist to check LID and LeTID behaviour, including for new technologies. Limits: LID can still appear in gallium-doped and n-type cells because of boron impurities in the wafer, and LeTID results after mitigation still differ between manufacturers. Even with low-LID modules, include stabilization losses in yield assumptions and confirm unexpected early losses with IV and flash testing.
<!-- review notes
- sentence 3: support check: partial - Passages say Ga p-type and n-type (PERC, HJT, n-PERT) are much less/not affected, but 'usual low-LID choices' is an inference; also LID can still occur.
- sentence 7: support check: partial - Passage advises accounting for stabilization in yield assumptions and verifying early losses with IV and flash testing, but doesn't say this applies 'even with' low-LID modules (it lists it alongside selecting them).
-->
Claims
typical_power_loss
c1 verified · fact
1–3 PERCENT
Conditions: Classic LID in c-Si modules, occurring in the first days of sun exposure
The loss that low-LID module selection is meant to avoid; mostly p-type multi and mono modules are affected.
verified by: joshuahamsaverified on: 2026-10-20
c2 verified · fact
≤ 10 PERCENT
Conditions: LeTID in susceptible modules (first seen with PERC), at module temperatures above 50 °C, on top of the LID loss
verified by: joshuahamsaverified on: 2026-10-20
c3 verified · fact
1–4 PERCENT
Conditions: Remaining LeTID degradation in modules whose manufacturers mitigate it; the figure depends on the manufacturer's method
Shows that mitigation reduces the loss but does not remove it, and results differ between manufacturers.
verified by: joshuahamsaverified on: 2026-10-20
c4 verified · fact
≤ 30 PERCENT
Conditions: Light soaking or LID effects in general, depending on technology
verified by: joshuahamsaverified on: 2026-10-20review note: support check: partial - Passage says LID/light soaking could entail losses up to 30%, but doesn't tie it to low-LID module selection or technology dependence explicitly; 'could potentially' is a bound.
Referenced by
Data