Cell current binning

This record is linked to Module Hotspot from Cell Damage, which shows up as cells or substrings running locally hot while the module is under load. One cause the sources list for a persistent hotspot is mismatch that pushes part of the module into reverse bias. Cracked cells, solder bond defects, soiling shadows and bypass diode behavior are other causes. The units given here do not describe cell current binning itself, including how it is done, how well it works or what its limits are. For hotspots found in the field, the sources describe a different response: isolate the string, confirm the thermal signature under load, replace the module if cell damage is confirmed, and retest string current after the repair. Treat a single thermal anomaly as a screening result. Confirm its electrical impact and that it repeats before approving a replacement.

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• sentence 1: support check: partial - The passage says hotspots appear as localized hot cells or substrings under load, but it doesn't link this record to a cell-damage hotspot item; it lists cracked cells only as one possible association.
• sentence 4: support check: partial - The mitigation steps match, but the evidence doesn't frame them as a 'different response' versus another source, and the 'sources' claim is weakly grounded. -->